APIX, CITX and BRIX are three internally developed tools Unified created to measure patent validity, value, and broadness using a combination of PTAB data from Unified's PTAB Portal and advanced machine-learning algorithms. These metrics generate ratings for any patent based on multiple variables tested on thousands of patents and may be used to assess entire patent portfolios in mere seconds. More details about each of these metrics is provided below.
APIX (Advanced Patent Index)
Purpose: APIX is an internally developed tool to measure patent validity. It rates the chances the PTAB may institute on a patent based on its similarity to all past institution decisions.
APIX Rating: Patents are ranked from D (least likely) to AA (most likely) to survive a PTAB challenge. The most important result from APIX was that PTAB has instituted more often on patents from examiners and art units with a higher allowance rate.
See also: What is APIX?
CITX (Citation Index)
Purpose: CITX is an internally developed tool to measure patent value. Studies have found market value is strongly correlated to Forward Citations. Every patent issued from the same year is indexed based on Forward Citations measured against a normal curve.
CITX Rating: Ranking of D (lowest value) to AA (highest value) is determined by how many standard deviations a patent is relative to the mean (similar to APIX).
BRIX (Broadness Index)
Purpose: BRIX uses the uniqueness of claim language in a Cooperative Patent Classification (CPC) to ascertain patent broadness or narrowness. It is based on 2 assumptions:
- Claims with fewer terms relative to their CPC patent class tend to be broader.
- Claims with fewer unique terms relative to their CPC patent class tend to be broader.
All the claims are then combined in a patent to create an aggregate BRIX score for that patent which is graded in quartiles based on their overall broadness. The aggregate score is based on a ranking system ranging from D (narrowest claims) to AA (broadest claims).
Portfolio Value Index (PVIX) Methodology
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